Research Facilities

 

AFM/STM Microscopy System INNOVA VEECO working in contact and tapping mode, phase imaging:

    • Conductive AFM Module
    • Electrostatic Force Microscopy Module
    • Scanning Capacitance Microscopy Module
    • Force Modulation Microscopy Module
    • Surface Potential Module
    • Force-Distance Measurements,
    • Magnetic Force Microscopy,
    • Scanning Tunneling Microscopy