Research Facilities

X-Ray Diffractometer SmartLab

SmartLab specifications:

Rotating anode generator:
  • Maximum rated output: 9 kW (45kV, 200mA),
  • Cu target
  • Focus size: 0.4 x 8 mm line/point
  • Goniometer:
  • 5-axis Vertical goniometer with horizontal sample positioning, 300 mm radius
  • Scanning mode: θs/θd coupled or θs, θd independent optical encoder controlled
  • In-plane scattering arm
  • Optics:
  • Focusing (Bragg-Brentano) or parallel beam diffractometer geometries; selection via Cross Beam Optical (CBO) technology
  • different monochromators/analyzers : Ge(220) 2/4 bounce monochromator, Ge(440) 4 bounce monochromator, Ge(220) 2 bounce analyzer, focussing/flat diffracted beam monchromator
  • variable divergence, scattering and receiving slits
  • -automatic optics and sample alignment
  • Detector
  • NaI Scintillation counter
  • HyPix-3000 Hybrid Pixel Array Detector
  • Accessories:
  • Sample stages: Rx-Ry tilt stage; X-Y mapping stage
  • Anton Paar DHS 1100 Domed Hot Stage (temperature range: 25 °C to 1100°C; atmospheres: air, inert gas, vacuum)
  • Capillary attachment for SAXS/USAXS
  • Multiple measurement techniques:
  • X-ray Powder diffraction (XRPD);
  • High resolution X-ray diffraction (HRXRD)
  • X-ray reflectometry (XRR) – thickness, roughness and density evaluation of individual layers of a multilayer thin film structure
  • Grazing incidence diffraction (GIXRD) -diffraction technique for very thin film layers
  • In-plane grazing incidence diffraction (IPGID) - true in-plane diffraction technique for ultra thin films down to monolayer size
  • Small angle X-ray scattering (SAXS) – particle/pore size analysis
  • Single crystal diffraction (SCD) – HR x-ray rocking curves (HR-XRC), HR reciprocal space mapping (HR-RSM), pole figures for single crystalline bulk or thin films