Research Facilities

AFM/STM Microscopy System INNOVA VEECO working in contact and tapping mode, phase imaging:

• Conductive AFM Module
• Electrostatic Force Microscopy Module
• Scanning Capacitance Microscopy Module
• Force Modulation Microscopy Module
• Surface Potential Module
• Force-Distance Measurements,
• Magnetic Force Microscopy,
• Scanning Tunneling Microscopy