Research Facilities

X-Ray Diffractometer SmartLab

SmartLab specifications:

Rotating anode generator:

Maximum rated output: 9 kW (45kV, 200mA),

Cu target

Focus size: 0.4 x 8 mm line/point

Goniometer:

5-axis Vertical goniometer with horizontal sample positioning, 300 mm radius

Scanning mode: θs/θd coupled or θs, θd independent optical encoder controlled

In-plane scattering arm

Optics:

Focusing (Bragg-Brentano) or parallel beam diffractometer geometries; selection via Cross Beam Optical (CBO) technology

different monochromators/analyzers : Ge(220) 2/4 bounce monochromator, Ge(440) 4 bounce monochromator, Ge(220) 2 bounce analyzer, focussing/flat diffracted beam monchromator

variable divergence, scattering and receiving slits

-automatic optics and sample alignment

Detector

NaI Scintillation counter

HyPix-3000 Hybrid Pixel Array Detector

Accessories:

Sample stages: Rx-Ry tilt stage; X-Y mapping stage

Anton Paar DHS 1100 Domed Hot Stage (temperature range: 25 °C to 1100°C; atmospheres: air, inert gas, vacuum)

Capillary attachment for SAXS/USAXS

Multiple measurement techniques:

X-ray Powder diffraction (XRPD);

High resolution X-ray diffraction (HRXRD)

X-ray reflectometry (XRR) – thickness, roughness and density evaluation of individual layers of a multilayer thin film structure

Grazing incidence diffraction (GIXRD) -diffraction technique for very thin film layers

In-plane grazing incidence diffraction (IPGID) - true in-plane diffraction technique for ultra thin films down to monolayer size

Small angle X-ray scattering (SAXS) – particle/pore size analysis

Single crystal diffraction (SCD) – HR x-ray rocking curves (HR-XRC), HR reciprocal space mapping (HR-RSM), pole figures for single crystalline bulk or thin films