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Research Facilities

 

Surface investigation

  • HR X-Ray Diffractometer (SmartLab)
  • X-ray Difractometer (Rigaku MiniFlex II)
  • Scanning Electron Microscope (SEM) with Energy Dispersive X-ray spectrometer (EDX)-(Hitachi TM3030 Plus)
  • Nanoindenter (Hysitron TI Premier)
  • Universal mechanical tester (TriboLab UMT Bruker)
  • Nano SAM Lab S Scanning Auger Microscopy System (Omicron)
  • Surface profilometer (Dektak 150)
  • AFM/STM microscopy system (INNOVA VEECO)
  • Auger Electron Spectroscopy (AES) – Modular PHY system
  • UV-Vis-NIR spectrophotometer (Jasco V-670)
  • Fourier Transform Infrared Spectroscopy – FT-IR (Jasco 6300)
  • Hall measurement system (Ecopia)
  • Vickers micro-hardness indenter
  • Coatings adhesion measurement system
  • Contact angle and surface energy measurement system (KSV-Instruments Attension TL101)
  • Potentiostat/galvanostat (VersaSTAT-3)
  • Pin-on-Disk tribometer

 

 

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