Research Facilities
Surface investigation
- HR X-Ray Diffractometer (SmartLab)
- X-ray Difractometer (Rigaku MiniFlex II)
- Scanning Electron Microscope (SEM) with Energy Dispersive X-ray spectrometer (EDX)-(Hitachi TM3030 Plus)
- Nanoindenter (Hysitron TI Premier)
- Universal mechanical tester (TriboLab UMT Bruker)
- Nano SAM Lab S Scanning Auger Microscopy System (Omicron)
- Surface profilometer (Dektak 150)
- AFM/STM microscopy system (INNOVA VEECO)
- Auger Electron Spectroscopy (AES) – Modular PHY system
- UV-Vis-NIR spectrophotometer (Jasco V-670)
- Fourier Transform Infrared Spectroscopy – FT-IR (Jasco 6300)
- Hall measurement system (Ecopia)
- Vickers micro-hardness indenter
- Coatings adhesion measurement system
- Contact angle and surface energy measurement system (KSV-Instruments Attension TL101)
- Potentiostat/galvanostat (VersaSTAT-3)
- Pin-on-Disk tribometer